The sample temperature is also precisely measured and compared with a reference material. The STA system is equipped with a microbalance that measure the mass of the sample as it experiences a prescribed heating/cooling regime. It measures the mass change and the heat released/ absorbed by the sample material during heating/cooling for such studies as: melting/ crystallization behavior, phase transitions, oxidation/reduction behaviour, decomposition, thermokinetics, glass transition, etc. The STA 449 F3 Jupiter is a powerful state–of–the–art thermal analysis tool for simultaneous Thermograivemetry (TG) and Differential Scanning Calorimetery (DSC) analyses on a sample. Simultaneous Thermal Analyzer (NETZSCH STA 449 F3 Jupiter) Overview
Laser diffraction particle size analysis ppt pdf#
Rigaku’s PDXL Comprehensive Analysis Package is used for data reduction, background elimination, search and peak match with ICDD PDF databases, crystallite size determination, % crystallinity determination, and quantitative analysis.
Instrument control and data processing are carried out using a PC. The system is equipped with a 2.0 kW Cu X–ray tube, NaI scintillation counter detector, graphite monochromator, and an automated 6–position sample changer with sample spinner. The 2θ positions of the diffraction peaks provide a unique fingerprint of the phases present and the intensity and spread of the peaks are used to obtain the quantity of each phase based on the Rietveld Quantitative Analysis method. The X–ray is diffracted by the atomic layers of the crystal, and the diffraction pattern is used for the analysis based on the Bragg’s diffraction law (nλ=2d sinθ). The X–ray is generated in a Cu x–ray tube, filtered by monochromator to increase sensitivity, collimated to concentrate, and is directed towards the sample. It is an essential tool in phase identification and quantification and crystal structure characterization for a wide range of applications such as materials, geology, forensic, food, pharmaceutical, and environmental studies. The Miniflex 600 is a benchtop general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. X–ray Diffractometer (Rigaku MiniFlex 600) Overview
Laser diffraction particle size analysis ppt Pc#
The system includes the ICP spectrometer, chillers, autosampler with probe wash station, and PC with iTEVA program for operating the machine. By comparing with emissions of a blank, the concentration of the analytes are calculated. The light intensity for each wavelength is measured with a photomultiplier. The light from different atoms is separated into its component wavelengths using a diffraction grating. Once the exited ions combine with electrons in the cooler regions of the torch and return to their low energy state, light with atom–specific wavelength is emitted. The sample is introduced to the Inductively Coupled Plasma – Optical Emission Spectrometer (ICE–OES) through a nebulizer and is then broken into atoms and ions in a plasma torch, created by purging argon in a RF (radio frequency) generator. The apparatus is widely used in analysis of water and dissolved inorganic materials (soil, minerals, metals, glass, waste, etc). The iCAP 6300 ICP–OES is a simultaneous spectrometer for rapid analysis of trace elements in a solution down to ppb–ppt levels. ICP– OES (Thermo Fisher Scientific iCAP 6300) Overview A computer system controls the instrument and displays results in a wide range of formats. The fully integrated system is composed of a measurement unit incorporating a diode laser, LED light source, photodetector array, side and rear scatter detectors, control section, sample chamber and a sample recirculating system (which incorporates an ultrasonic probe, flow cell and a centrifugal circulation pump that stirs, disperses and pumps). The existing unit (standard) measures the distribution of particles suspended in a liquid (water, ethanol, and isopropanol), and is capable of performing measurements on dry powders once equipped with a Dry Measurement Unit.
The instrument applies the Mie Scattering Theories using a diode laser of 650nm wavelength and a LED of 405nm wavelength for the measurement of particle size distribution of powders, suspensions or emulsions. Applications range from studies involving nanoparticles to soils and sediments. The Partica LA-950 Laser Diffraction Particle Size Distribution Analyzer is a high-end particle sizing instrument. Characterization Techniques Laser Particle Size Analyzer (Horiba Partica LA–950) Overview
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